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X-RAY Diffractometer XRD

X-RAY Diffractometer XRD

What is X-ray Powder Diffraction (XRD)

X-ray powder diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined.

Applications

X-ray powder diffraction is most widely used for the identification of unknown crystalline materials (e.g., minerals, inorganic compounds). Determination of unknown solids is critical to studies in geology, environmental science, material science, engineering, and biology.

Other applications include:

characterization of crystalline materials

identification of fine-grained minerals such as clays and mixed layer clays that are difficult to determine optically

determination of unit cell dimensions

measurement of sample purity

With specialized techniques, XRD can be used to:

determine crystal structures using Rietveld refinement

determine modal amounts of minerals (quantitative analysis)

characterize thin film samples by:

determining lattice mismatch between film and substrate and to inferring stress and strain

determining dislocation density and quality of the film by rocking curve measurements

measuring superlattices in multilayered epitaxial structures

determining the thickness, roughness, and density of the film using glancing incidence X-ray reflectivity measurements

make textural measurements, such as the orientation of grains, in a polycrystalline sample

Sample types:

Epitaxial thin films

Polycristalline thin films

powders

Maximum wafer size: 6"

Measurements:

Rocking curves and omega/2theta measurement of epitaxial films

Crystal orientation/offcut

Stresses/strain of single crystal thin film

High-speed wide angle x-ray diffraction and fast mode reciprocal space mapping using HyPix-3000 hybrid Pixel array detector.

Density and film thickness determination (x-ray reflectivity XRR)

Pole figures

Low angle measurement as low as 0.1 °

In-plane measurements

Accessories:

Parallel or divergent beam selection using a simple slit

Motorized optics alignment

Motorized slits

Incident beam Ge 4x 220 monochromator

Diffracted beam Ge2x 220 monochromator

Solar slits for both out of plane and in-plane measurements

 

Training required to operate:

Radiation safety training is required prior to requesting training on the instrument via iLab. Once your radiation safety training is complete, bring your dosimeter badge, which is required to operate the instrument.

    $110,000.00Price
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